Static Crosstalk Noise Analysis: For Deep Sub Micron Digital Designs

Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs (Repost)

Pinhong Chen, Desmond A. Kirkpatrick, Kurt Keutzer, "Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs"
English | 2004-06-17 | ISBN: 1402080913 | 113 pages | PDF | 6.4 mb
Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs (Repost)

Pinhong Chen, Desmond A. Kirkpatrick, Kurt Keutzer, "Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs (Solid Mechanics and Its Applications)"
English | 2004-07-07 | ISBN: 1402080913 | 126 pages | PDF | 6.4 mb
Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies (repost)

Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies by Stephan Henzler
English | ISBN: 1402050801 | 2006 | PDF | 183 pages | 5,6 mb

In the deep sub-micron regime, the power consumption has become one of the most important issues for competitive design of digital circuits. Due to dramatically increasing leakage currents, the power consumption does not take advantage of technology scaling as before.
Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies (repost)

Stephan Henzler, "Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies"
English | ISBN: 1402050801 | edition 2006 | PDF | 183 pages | 5.6 mb

In the deep sub-micron regime, the power consumption has become one of the most important issues for competitive design of digital circuits. Due to dramatically increasing leakage currents, the power consumption does not take advantage of technology scaling as before.
Matching Properties of Deep Sub-Micron MOS Transistors (Repost)

Matching Properties of Deep Sub-Micron MOS Transistors
Publisher: Springer | ISBN: 0387243143 | edition 2005 | PDF | 206 pages | 14,8 mb

Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermore, due to the down-scaling of device dimensions, transistor mismatch has an increasing impact on digital circuits. The matching properties of MOSFETs are studied at several levels of abstraction.
Matching Properties of Deep Sub-Micron MOS Transistors (Repost)

Matching Properties of Deep Sub-Micron MOS Transistors
Publisher: Springer | pages: 206 | 2005 | ISBN: 0387243143 | PDF | 14,8 mb

Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermore, due to the down-scaling of device dimensions, transistor mismatch has an increasing impact on digital circuits.
Regular Fabrics in Deep Sub-Micron Integrated-Circuit Design (repost)

Regular Fabrics in Deep Sub-Micron Integrated-Circuit Design by Fan Mo and Robert K. Brayton
English | 1st edition | May 17, 2004 | ISBN-10: 1402080409 | 258 pages | PDF | 17 Mb

Matching Properties of Deep Sub-Micron MOS Transistors [Repost]  

Posted by ChrisRedfield at July 17, 2014
Matching Properties of Deep Sub-Micron MOS Transistors [Repost]

Jeroen A. Croon, ‎Willy M. C. Sansen, ‎Herman E. Maes - Matching Properties of Deep Sub-Micron MOS Transistors
Published: 2005-03-24 | ISBN: 0387243143, 1441937188 | PDF | 206 pages | 12 MB
Matching Properties of Deep Sub-Micron MOS Transistors (repost)

Jeroen A. Croon, Willy Sansen, Herman E. Maes, "Matching Properties of Deep Sub-Micron MOS Transistors"
English | ISBN: 0387243143 | edition 2005 | PDF | 206 pages | 12 mb

Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET.
Regular Fabrics in Deep Sub-Micron Integrated-Circuit Design (repost)

Regular Fabrics in Deep Sub-Micron Integrated-Circuit Design by Fan Mo and Robert K. Brayton
English | 1st edition | May 17, 2004 | ISBN-10: 1402080409 | 258 pages | PDF | 13,6 Mb

Regular Fabrics in Deep Sub-Micron Integrated-Circuit Design discusses new approaches to better timing-closure and manufacturability of DSM Integrated Circuits. The key idea presented is the use of regular circuit and interconnect structures such that area/delay can be predicted with high accuracy.